Parallel Processor Architecture with a New Algorithm for Simultaneous Processing of MIPS-Based Series Instructions
Abstract
Keywords
References
W. Hu "Godson-3B: A 1 GHz 40 W 8-Core 128GFLOPS processor in 65 nm CMOS" IEEE ISSCC Dig. Tech. Papers pp. 76-78 2011.
Dodd, P.E., and L.W. Massengill. “Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics.” IEEE Transactions on Nuclear Science 50, no. 3 (June 2003): 583–602. doi:10.1109/tns.2003.813129.
C. Carmichael "Correcting single-event upsets in virtex-4 fpga configuration memory" in XAPP 197 Xilinx Inc. 2001.
Azambuja, José Rodrigo, Samuel Pagliarini, Lucas Rosa, and Fernanda Lima Kastensmidt. “Exploring the Limitations of Software-Based Techniques in SEE Fault Coverage.” Journal of Electronic Testing 27, no. 4 (April 9, 2011): 541–550. doi:10.1007/s10836-011-5218-7.
Fan, Bao-Xia, Liang Yang, Jiang-Mei Wang, Ru Wang, Bin Xiao, Ying Xu, Dong Liu, and Ji-Ye Zhao. “Physical Implementation of the 1GHz Godson-3 Quad-Core Microprocessor.” Journal of Computer Science and Technology 25, no. 2 (March 2010): 192–199. doi:10.1007/s11390-010-9316-2.
Lima, F., L. Carro, R. Velazco, and R. Reis. “Injecting Multiple Upsets in a SEU Tolerant 8051 Micro-Controller.” Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) (n.d.). doi:10.1109/olt.2002.1030217.
Bolchini, C., A. Miele, F. Salice, and D. Sciuto. “A Model of Soft Error Effects in Generic IP Processors.” 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’05) (n.d.). doi:10.1109/dftvs.2005.10.
DOI: 10.28991/ijse-01126
Refbacks
- There are currently no refbacks.